Center for Directed Energy (CDE)

Center for Directed Energy (CDE)
AFIT Faculty: Maj Milo W. Hyde IV
CONTACT INFORMATION
Name: Maj Milo W Hyde IV
Title: Department of Electrical and Computer Engineering
Commercial Phone: 937-255-3636 (4371)
DSN Phone: 785-3636 (4371)
EDUCATION

Ph.D. Electrical Engineering, Air Force Institute of Technology, 2010

M.S. Electrical Engineering, Air Force Institute of Technology, 2006

B.S. Computer Engineering, Georgia Institute of Technology, 2001
RESEARCH INTERESTS

Electromagnetic theory, guided-wave applications, electromagnetic material characterization, stealth technology, radiation and scattering, propagation through random media, scattering from random media, adaptive optics, optics, polarimetry.

EXPERTISE
  • OPTICS
PUBLICATIONS & RESEARCH PAPERS
Refereed Archival Journal Papers
 
1. Michael Havrilla, Andrew Bogle**, Milo Hyde IV, and Ed Rothwell, “EM material characterization of conductor backed media using a NDE microstrip probe,” in Studies in Applied Electromagnetics and Mechanics: Electromagnetic Nondestructive Evaluation (XVI), vol. TBD, pp. TBD, TBD. JIF: N/A
 
2. M. Hyde, M. Havrilla, A. Bogle**, and N. Lehman*, “Broadband characterization of materials using a dual-ridged waveguide,” IEEE Transactions on Instrumentation and Measurement, vol. TBD, no. TBD, pp. TBD, TBD. JIF: 1.214
 
3. Milo W. Hyde IV, Santasri Basu**, Mark F. Spencer*, Salvatore J. Cusumano, and Steven T. Fiorino, “Physical optics solution for the scattering of a partially-coherent wave from a statistically rough material surface,” Optics Express, vol. 21, no. 6, pp. 6807-6825, Mar 2013. JIF: 3.587
 
4. Santasri Basu**, Milo W. Hyde IV, Salvatore J. Cusumano, Michael A. Marciniak, and Steven T. Fiorino, “Examining the validity of using a Gaussian Schell-model source to model the scattering of a fully coherent Gaussian beam from a rough impedance surface,” Optical Engineering, vol. 52, no. 3, 038001 (9 pp.), Mar 2013. JIF: 0.959
 
5. M. W. Hyde IV, M. J. Havrilla, A. E. Bogle**, E. J. Rothwell, and G. D. Dester, “An improved two-layer method for nondestructively characterizing magnetic sheet materials using a single rectangular waveguide probe,” Electromagnetics, vol. 32, no. 7, pp. 411-425, 2012. JIF: 0.789
 
6. M. Hyde, M. Havrilla, A. Bogle**, and E. Rothwell, “Nondestructive material characterization of a free-space-backed magnetic material using a dual-waveguide probe,” IEEE Transactions on Antennas and Propagation, vol. 60, no. 2, pp. 1009-1019, Feb 2012. JIF: 2.151
 
7. M. Seal*, M. Hyde, and M. Havrilla, “Nondestructive complex permittivity and permeability extraction using a two-layer dual-waveguide probe measurement geometry,” Progress in Electromagnetic Research, vol. 123, pp. 123-142, 2012. JIF: 5.298
 
8. M. Hyde, M. Havrilla, and A. Bogle**, “A novel and simple technique for measuring low-loss materials using the two flanged waveguides measurement geometry,” Measurement Science and Technology, vol. 22, no. 8, 085704 (10 pp.), Jul 2011. JIF: 1.494
 
9. M. Hyde, S. Cain, J. Schmidt, and M. Havrilla, “Material classification of an unknown object using turbulence degraded polarimetric imagery,” IEEE Transactions on Geoscience and Remote Sensing, vol. 49, no. 1, pp. 264-276, Jan 2011. JIF: 2.895
 
10. M. Hyde, J. Schmidt, M. Havrilla, and S. Cain, “Determining the complex index of refraction of an unknown object using turbulence-degraded polarimetric imagery,” Optical Engineering, vol. 49, no. 12, 126201 (11 pp.), Dec 2010. JIF: 0.959
 
11. M. Hyde, J. Schmidt, M. Havrilla, and S. Cain, “Enhanced material classification using turbulence-degraded polarimetric imagery,” Optics Letters, vol. 35, no. 21, pp. 3601-3603, Oct 2010. JIF: 3.399
 
12. G. Dester*, E. Rothwell, M. Havrilla, and M. Hyde, “Error analysis of a two-layer method for the electromagnetic characterization of conductor-backed absorbing materials using an open-ended waveguide probe,” Progress in Electromagnetics Research B, vol. 26, pp. 1-21, Sep 2010. JIF: N/A
 
13. M. Hyde, J. Schmidt, and M. Havrilla, “A geometrical optics polarimetric bidirectional reflectance distribution function for dielectric and metallic surfaces,” Optics Express, vol. 17, no. 24, pp. 22138-22153, Nov 2009. JIF: 3.587
 
14. M. Hyde, M. Havrilla and P. Crittenden, “A novel method for determining R-card sheet resistance using the transmission coefficient measured in free-space or waveguide systems,” IEEE Transactions on Instrumentation and Measurement, vol. 58, no. 7, pp. 2228-2233, Jul 2009. JIF: 1.214
 
15. M. Hyde, J. Stewart, M. Havrilla, W. Baker, E. Rothwell and D. Nyquist, “Nondestructive electromagnetic material characterization using a dual waveguide probe: a full wave solution,” Radio Science, vol. 44, no. 3, RS3013 (13 pp.), Jun 2009. JIF: 1.075
 
16. J. Lee*, M. Havrilla, M. Hyde, and E.J. Rothwell, “Scattering from a cylindrical resistive sheet using a modified physical optics current,” IET Microwaves, Antennas & Propagation, vol. 2, no. 5, pp. 482-491, Oct 2008. JIF: 0.681
 
17. M. Hyde and M. Havrilla, “A nondestructive technique for determining complex permittivity and permeability of magnetic materials using two flanged rectangular waveguides,” Progress in Electromagnetic Research, vol. 79, pp. 367-386, Jan 2008. JIF: 5.298
 
 
Refereed Archival Journal Papers (Submitted)
 
1. M. Hyde and M. Havrilla, “A clamped dual-ridged-waveguide measurement system for the broadband, nondestructive characterization of sheet materials,” Radio Science, vol. TBD, no. TBD, pp. TBD, TBD. JIF: 1.075
 
2. M. Hyde and M. Havrilla, “Broadband, nondestructive characterization of PEC-backed materials using a dual-ridged-waveguide probe,” IEEE Transactions on Microwave Theory and Techniques, vol. TBD, no. TBD, pp. TBD, TBD. JIF: 1.853
 
3. Mark F. Spencer* and Milo W. Hyde IV, “Rough surface scattering for active-illumination systems,” SPIE Newsroom, vol. TBD, no. TBD, pp. TBD, TBD. JIF: N/A
 
Refereed Archival Journal Papers (In Preparation/To Be Submitted)
 
1. M. Havrilla, M. Hyde, and D. Sjoberg, “Two novel transmission/reflection methods to characterize dielectric and magnetic materials at high temperatures,” IEEE Transactions on Instrumentation and Measurement, vol. TBD, no. TBD, pp. TBD, TBD. JIF: 1.214
 
2. Michael J. Steinbock*, Milo W. Hyde, and Jason D. Schmidt, “Branch-point-tolerant reconstructor comparison for deep turbulence adaptive optics,” Optics Express, vol. TBD, no. TBD, pp. TBD, TBD. JIF: 3.587
 
3. Andrew E. Bogle**, Michael J. Havrilla, and Milo W. Hyde IV, “Resonant slot electromagnetic material characterization technique,” Progress in Electromagnetics Research, vol. TBD, pp. TBD, TBD. JIF: 5.298

 
4. M. W. Hyde IV and M. J. Havrilla, “Simple, broadband material characterization using dual-ridged waveguide to rectangular waveguide transitions,” IEEE Transactions on Electromagnetic Compatibility, vol. TBD, no. TBD, pp. TBD, TBD. JIF: 1.178
 
Refereed Conference Papers (Full Paper Review)
 
1. Mark Spencer* and Milo Hyde, “Phased beam projection from tiled apertures in the presence of turbulence and thermal blooming,” Proceedings of SPIE (SPIE Optics and Photonics), vol. 8877, TBD pp., San Diego, CA, Aug 2013.
 
 
2. Melissa Sawyer* and Milo Hyde, “Material characterization using passive multispectral polarimetric imagery,” Proceedings of SPIE (SPIE Defense, Security, and Sensing), vol. 8713, 15 pp., Baltimore, MD, Apr 2013.
 
 
3. Santasri Basu**, Milo W. Hyde IV, Jack E. McCrae Jr.**, and Steven T. Fiorino, “Scattering from a rough impedance surface in presence of atmospheric turbulence,” Proceedings of SPIE (SPIE Defense, Security, and Sensing), vol. 8732, 9 pp., Baltimore, MD, Apr 2013.
 
 
4. M. W. Hyde IV, S. Basu**, S. J. Cusumano, and M. F. Spencer*, “Scalar wave solution for the scattering of a partially coherent beam from a statistically rough metallic surface,” Proceedings of SPIE (SPIE Optical Systems Design), vol. 8550, 15 pp., Barcelona, Spain, Nov 2012.
 
 
5. M. J. Havrilla, A. E. Bogle**, M. W. Hyde, and E. J. Rothwell, “Electromagnetic material characterization of a curved conductor-backed media using an NDE microstrip probe,” Proceedings of the 17th International Workshop on Electromagnetic Nondestructive Evaluation (ENDE), pp. 60-61, Rio De Janeiro, Brazil, Aug 2012.
 
 
6. M. Spencer* and M. W. Hyde, “An investigation of stair mode in optical phased arrays using tiled apertures,” Proceedings of SPIE (SPIE Optics and Photonics), vol. 8520, 15 pp., San Diego, CA, Aug 2012.
 
 
7. M. Kim* and M. W. Hyde, “Adaptive binary material classification of an unknown object using polarimetric imagery degraded by atmospheric turbulence,” Proceedings of SPIE (SPIE Optics and Photonics), vol. 8500, 11 pp., San Diego, CA, Aug 2012.
 
 
8. M. Steinbock* and M. W. Hyde, “Phase discrepancy induced from least squares wavefront reconstruction of wrapped phase measurements with high noise or large localized wavefront gradients,” Proceedings of SPIE (SPIE Optics and Photonics), vol. 8517, 16 pp., San Diego, CA, Aug 2012.
 
9. M. Hyde andM. Havrilla, “Design of an open-ended coaxial probe for broadband, low-footprint nondestructive characterization of PEC-backed materials,” IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, pp. 1599-1602, Graz, Austria, May 2012.
 
 
10. S. Basu**, S. J. Cusumano, M. W. Hyde IV, M. A. Marciniak, and S. T. Fiorino, “Validity of using Gaussian Schell model for extended beacon studies,” Proceedings of SPIE (SPIE Defense, Security, and Sensing), vol. 8380, 13 pp., Baltimore, MD, Apr 2012.
 
 
11. M. Steinbock*, J. Schmidt, and M. Hyde, “Comparison of branch point tolerant wavefront reconstructors in the presence of simulated noise effects,” IEEE Aerospace Conference (AeroConf) Proceedings, pp. 1-13, Big Sky, MT, Mar 2012.
 
 
12. M. Havrilla, A. Bogle**, M. Hyde, and E. Rothwell, “Electromagnetic material characterization of conductor-backed media using a NDE microstrip probe,” Proceedings of the International Conference on Electromagnetics in Advanced Applications (ICEAA), pp. 656-659, Torino, Italy, Sep 2011.
 
 
13. M. Hyde and M. Havrilla, “Reducing the measurement footprint in the characterization of low-loss materials using the flanged-waveguide measurement geometry,” Proceedings of the International Conference on Electromagnetics in Advanced Applications (ICEAA), pp. 43-46, Sydney, Australia, Sep 2010.
 
 
14. M. Havrilla and M. Hyde, “Dual-probe lowloss material extraction technique,” International Symposium on Electromagnetic Theory (EMTS) Proceedings, pp. 268-271, Berlin, Germany, Aug 2010.
 
 
15. M. Havrilla and M. Hyde, “Nondestructive clamped waveguide lowloss material extraction technique,” Applied Computational Electromagnetics Society (ACES) Conference Proceedings, pp. 1-4, Tampere, Finland, Apr 2010.
 
 
16. J. Massman*, M. Havrilla, K. Whites, and M. Hyde, “A stepped flange waveguide technique for determining tapered R-card sheet impedance,” Asia-Pacific Microwave Conference (APMC) Proceedings, pp. 1769-1772, Yokohama, Japan, Dec 2010.
 
 
17. M. Hyde and M. Havrilla, “Sensitivity of dual waveguide probe complex permittivity and permeability measurement to probe lift-off error,” Proceedings of the International Conference on Electromagnetics in Advanced Applications (ICEAA), pp. 192-195, Torino, Italy, Sep 2009.
 
 
18. Brian B. Glover, Keith W. Whites, Milo W. Hyde, and Michael J. Havrilla, “Complex permittivity of carbon loaded dielectric sheets with printed metallic square rings,” Proceedings of the 2nd International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, pp. 762-764, Pamplona, Spain, Sep 2008.
 
 
19. M. Hyde and M. Havrilla, “Electromagnetic characterization of two-layer dielectrics using two flanged rectangular waveguides,” IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, pp. 1648-1652, Victoria, British Columbia, Canada, May 2008.
 
 
20. M. Havrilla and M. Hyde, “Dyadic Green’s function of an imperfectly-conducting dual waveguide probe,” Asia-Pacific Microwave Conference (APMC) Proceedings, pp. 741-744, Bangkok, Thailand, Dec 2007.
 
 
21. M. Hyde and M. Havrilla, “Measurement of complex permittivity and permeability using two flanged rectangular waveguides,” IEEE International Microwave Symposium (IMS) Proceedings, pp. 531-534, Honolulu, Hawaii, Jun 2007.
 
 
22. M. Hyde, M. Havrilla, and P. Crittenden, “Free-space and waveguide technique for determining the resistivity of an R-card using the forward transmission coefficient,” Antennas, Radar and Wave Propagation (ARP) Conference Proceedings, pp. 1-6, Banff, Alberta, Canada, Jul 2006.
 
 
Refereed Conference Papers (Abstract Reviewed)
 
1. Milo W. Hyde IV and Michael J. Havrilla, “Broadband, nondestructive characterization of PEC-backed materials using a dual-ridged-waveguide probe,” URSI National Radio Science Meeting Abstracts, p. TBD, Lake Buena Vista, FL, Jul 2013.
 
 
2. Santasri Basu**, Milo W. Hyde, Jack E. McCrae**, and Steven T. Fiorino, “Examining the validity of using a Gaussian Schell-model source to model an extended beacon,” Wave Optics of Deep Atmospheric Turbulence MURI Annual Review Meeting, p 2, Arlington, VA, Jun 2013.
 
 
3. M. Hyde and M. Havrilla, “Broadband material characterization using dual-ridged waveguides,” Material Measurement Working Group Conference Proceedings, 1 p., Dayton, OH, May 2013.
 
 
4. Michael J. Steinbock*, Milo W. Hyde, and Jason D. Schmidt, “Simulated adaptive optics performance for a single-path deep turbulence scenario,” Directed Energy Professional Society (DEPS) Annual Directed Energy Symposium, p. 35, Albuquerque, NM, Nov 2012.
 
 
5. M. Steinbock* and M. W. Hyde, “Comparison of wavefront reconstruction techniques for extended turbulence beam projection applications,” Directed Energy Professional Society (DEPS) Beam Control Conference, p. 15, Broomfield, CO, Jun 2012.
 
 
6. M. Havrilla and M. Hyde, “Complex media, symmetry and material properties,” Material Measurement Working Group Conference Proceedings, 1 p., Rapid City, SD, Oct 2011.
 
 
7. T. Olney*, M. Havrilla, and M. Hyde, “A simple non-destructive method for characterizing non-dispersive, low-loss dielectrics,” URSI National Radio Science Meeting Abstracts, p. URSI124.6, Spokane, WA, Jul 2011.
 
 
8. M. Havrilla, A. Bogle**, M. Hyde, and E. Rothwell, “Material characterization of a curved conductor-backed media using a conformal NDE microstrip probe,” URSI National Radio Science Meeting Abstracts, p. URSI339.4, Spokane, WA, Jul 2011.
 
 
9. M. Spencer* and M. Hyde, “Rough surface scattering as applied to laser target interaction of a multi-fiber laser source,” Directed Energy Professional Society (DEPS) Beam Control Conference, p. 8, Orlando, FL, May 2011.
 
 
10. M. Havrilla, A. Bogle**, M. Hyde, and E. Rothwell, “RF material characterization of conductor-backed media using a NDE microstrip probe,” URSI National Radio Science Meeting Abstracts, p. 22, Boulder, CO, Jan 2011.
 
 
11. M. Havrilla and M. Hyde, “Clamped waveguide lowloss material characterization technique,” Microwave Materials and Their Applications (MMA) Conference, p. 100, Warsaw, Poland, Sep 2010.
 
 
12. M. Hyde and M. Havrilla, “Determining complex permittivity, permeability, and thickness of a PEC-backed material using a dual waveguide probe,” European Electromagnetics (EUROEM) Conference Proceedings, p. HPEM-48, Lausanne, Switzerland, Jul 2008.
 
 
13. M. Havrilla, M. Hyde, and J. Stewart, “MFIE formulation and uncertainty analysis of a dual rectangular waveguide probe utilized for the EM characterization of conductor-backed lossy materials,” URSI North American Radio Science Meeting, p. URSI275, Ottawa, Canada, Jul 2007.
 
 
14. J. Lee*, M. Havrilla, M. Hyde, and E. Rothwell, “3D bistatic scattering from a curved resistive sheet using a modified PO current and numerical simulation,” URSI National Radio Science Meeting Abstracts, p. 348, Albuquerque, NM, Jul 2006.
AWARDS & HONORS
2013 Military Officers Association of America Outstanding Military Faculty Award
2012 Elevated to IEEE Senior Member
2012 Eta Kappa Nu (Delta Xi Chapter) Outstanding Teaching Award for Electrical and Computer
Engineering
2010 International Conference on Electromagnetics in Advanced Applications (ICEAA) Young Scientist
Best Paper Award (Honorable Mention)
2007 Air Force Commendation Medal
2007 Sensors Directorate Raymond C. Rang Mission Support Award
2007 Top Third Graduate Squadron Officer School
2006 Distinguished Graduate Air Force Institute of Technology
2005 Inducted into Tau Beta Pi Honor Society
2004 Air Force Achievement Medal
2004 49th Fighter Wing Chief of Staff Team Excellence Award
2003 49th Maintenance Operations Squadron Company Grade Officer of the Quarter
2002 Distinguished Graduate Aircraft Maintenance Officer School
2001 With Highest Honor Graduate Georgia Institute of Technology
COURSES

OENG 645 Wave Optics 1

EENG 716 Imaging Through Turbulence

OENG 646 Wave Optics II

EENG 086 Intro to Probability & Statistics

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