Ph.D. Cornell University, M.S. Cornell University.
M. Phil. University of Cambridge, UK.
A.B. Harvard University.
VLSI Design.
The Physical Design of the POWER6 Microprocessor
Rent's rule for ultralarge-scale integrated circuitry and applications
On-chip interconnect requirements
Statistical models for the VLSI route problem
Non-linear and quantum optics
Low-temperature physics
Electron microscopy
Atomic physics
Patents:
Digital instant camera having a printer.
United States Patent 6628333. Inventors: Gowda, Sudhir Muniswamy (Ossining, NY), Lanzerotti, Mary Yvonne (Carmel, NY), Pearson, Dale Jonathan (Yorktown Heights, NY), Wong, Hon-sum Philip (Chappaqua, NY). Application Number: 08/967853. Publication Date: 09/30/2003.
Method of extracting properties of back end of line (BEOL) chip architecture.
United States Patent 7260810. Inventors: Filippi Jr., Ronald G. (Wappingers Falls, NY, US), Fiorenza, Giovanni (Pomona, NY, US), Liu Xiao Hu, Croton-on-Hudson, NY, US), Murray, Conal Eugene (Yorktown Heights, NY, US), Northrop, Gregory Allen (Putnam Valley, NY, US), Shaw, Thomas M. (Peekskill, NY, US), Wachnik, Richard Andre′ (Mount Kisco, NY, US), Wisniewski, Mary Yvonne Lanzerotti (Yorktown Heights, NY, US). Application Number: 10/68747. Publication Date: 08/21/2007.
System for identification of defects on circuits or other arrayed products.
United States Patent 7346470. Inventors: Wisniewski, Mary (Yorktown Heights, NY, US), Yashchin, Emmanuel (Yorktown Heights, NY, US), Landers, Christina (Wappingers Falls, NY, US), Takken, Asya (Brewster, NY, US), Trapp, Brian (Poughkeepsie, NY, US). Application Number: 10/459132. Publication Date: 03/18/2008.
Design structure and system for identification of defects on circuits or other arrayed products.
United States Patent 7752581. Inventors: Lanzerotti, Mary (Trumbull, CT, US), Yashchin, Emmanuel (Yorktown Heights, NY, US), Landers, Christina (Wappingers Falls, NY, US), Takken, Asya (Brewster, NY, US), Trapp, Brian (Poughkeepsie, NY, US). Application Number: 11/926605. Publication Date: 07/06/2010.