|Student Name:||Capt Jeremy Best|
|Thesis:||ELECTRON DAMAGE EFFECTS ON CARBON NANOTUBE THIN FILMS|
|Location:||Bldg 646 Room 207|
|Date & Time:||02/12/2013 at 1100|
|Abstract:|| Thin films (~50-100nm) of electronic type separated (metallic and semiconducting) single walled carbon nanotubes deposited on SiO2 - Si substrates are investigated pre- and post-irradiation using Raman Spectroscopy and ex-situ temperature dependant Hall measurements to determine the damage effects and mechanisms of device degradation following high fluence irradiation (> 10^17 e/cm2) at an electron energy of 500 keV.