|Student Name:||Nathan Lehman|
|Thesis:||Constitutive Parameter Measurement Using Double Ridge Waveguide|
|Location:||Bldg 640 Room 317|
|Date & Time:||02/21/2013 at 1000|
|Abstract:|| Electromagnetic materials characterization is important in the design of systems that interact with electromagnetic waves. Determining the constitutive parameters of a material is a vast area of research and practice. For this paper, discussion will focus on a destructive method using waveguides in the frequency range of 6 - 18 GHz. Traditional methods to perform these measurements include coaxial cable, stripline, focus beam and rectangular waveguide devices. This work will compare the use of Double Ridged Waveguide (DRWG) to these other methods and will discuss the attributes and drawbacks of this new approach. The most similar method in performing measurements is with rectangular waveguide and the primary focus will be on this comparison. DRWG has a much larger bandwidth at the cost of being more difficult to use. The added difficulties include material fabrication and mathematical modeling. While DRWG has been studied, this is the first time it has been applied to material measurements.