|Student Name:||2Lt Michael K Seery|
|Thesis:||Complex VLSI Feature Comparison for Commercial Microelectronics Verification|
|Location:||ENG Conference Room (Building 640, Room 317)|
|Date & Time:||02/12/2014 at 1300|
|Abstract:|| Shortcomings in IC verification make for glaring vulnerabilities in the form of hardware backdoors, or extraneous operation modes that allow unauthorized, undetected access. The DARPA TRUST program addressed the need for verification of untrusted circuits using industry-standard and custom software. The process developed under TRUST has not been tested using real-world circuits outside of the designated TRUST test cases. This research demonstrates the potential of applying software designed for TRUST test articles on microchips from questionable sources. A specific process is developed for both transistor-level library cell verification and gate-level circuit verification. The relative effectiveness and scalability of the process is assessed.