Dr. Michael J. Havrilla, Professor of Electrical Engineering

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DSN: 785-3636 x4582
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Education

 

Ph.D.   Electrical Engineering, Michigan State University, 2001
M.S.     Electrical Engineering, Michigan State University, 1989
B.S.      Physics, Michigan State University, 1987
B.S.      Mathematics, Michigan State University, 1987

Awards

 

2013 Nominee – AFIT/ENG, AF Outstanding Engineer Award, Mid-Career Civilian Category, February 2013 Nominee – AFIT/ENG, Engineering Achievement Award, February 2013
2012 Honorable Mention – AF, John L. McLucas Basic Research Award, July 2012.
2012 Nominee – AFIT/ENG, John L. McLucas Basic Research Award, February 2012
2010 Guided student to present a paper at the 2010 International Conference on Electromagnetics in        
         Advanced Applications leading to a special young scientist award in recognition to Dr. M. Hyde for   
         the paper "Reducing the Measurement Footprint in the Characterization of Low-loss Materials Using
         the Flanged-waveguide Measurement Geometry" coauthored by M. Hyde and M. Havrilla.
2009 Elected Full Member, Commission B, International Union of Radio Science, June 2009.
AFIT Instructor of the Quarter Award, Fall 2009.
2008  Nominee, AF Outstanding Engineer Award, Mid-Career Civilian Category, May 2008.
Nominee, HKN Honor Society Instructor of the Year, March 2008.
2007  Elected Full Member, Sigma Xi Honor Society, October 2007.
Featured article, J. Luminati*, T. Hale, M. Temple, M. Havrilla and M. Oxley, “Cross-range aliasing 
        reduction in SAR imagery using stepped-frequency waveforms,” IEEE Transactions on Aerospace and
        Electronic Systems, vol. 43, no. 1, pp. 163-175, January 2007.
2006    Inducted, HKN Honor Society, November 2005.
Best student paper award, 2nd place, J. Stewart, Antenna Measurement Techniques Association Conference, advised by M. Havrilla, October 2006.
2005    Elected Senior Member, IEEE, for significant professional technical accomplishment.
2004    Best Student Paper Award, A. Bogle, Antenna Measurement Techniques Association Conference, committee advisor M. Havrilla, October 2004.
2004    AFIT Dean’s Award, S. Dorey, advised by M. Havrilla, March 2004.
2004    Best Paper, Antenna Measurement Techniques Association Conference, October 2004.
2003    Best Student Paper Award, S. Dorey, Antenna Measurement Techniques Association Conference,
            advised by M. Havrilla, October 2003.
2001    Research Fellowship, Electrical Engineering, Michigan State University.
2001    Nominee, Excellence-in-Teaching, Michigan State University.
1995    SR-71 Aircraft program award, Lockheed Skunkworks, citation for EM performance.
1989    Teaching Fellowship, Electrical Engineering, Michigan State University.
1989     Finalist, Outstanding Teaching Assistant, Michigan State University.

Publications

 

Refereed Archival Journal Papers
 
1.      M. Havrilla, A. Bogle, M. Hyde and E. Rothwell, “Electromagnetic material characterization of a curved conductor-backed media using an NDE microstrip probe,” Proceedings of the ENDE Electromagnetic Nondestructive Evaluation Conference, Accepted (awaiting citation information), vol. TBD, no. TBD, pp. TBD-TBD, TBD 2013. This 8 page journal paper was initially a 2 page abstract that was presented at the ENDE Conference during July 2012.
 
2.      M. Hyde and M. Havrilla, “A clamped dual-ridged-waveguide measurement system for the broadband, nondestructive characterization of sheet materials,” Radio Science, Accepted (awaiting citation information), vol. TBD, no. TBD, pp. TBD, TBD 2013.
 
3.      J. Tang, B. Crowgey, O. Tuncer, E. Rothwell, B. Shanker, L. Kempel and M. Havrilla, “Characterization of Biaxial Materials Using a Partially-Filled Rectangular Waveguide,” Applied Computational Electromagnetics Journal, Accepted (awaiting citation information), vol. TBD, no. TBD, pp. TBD-TBD, TBD 2013.
 
4.      M. Hyde, M. Havrilla, A. Bogle and *N. Lehman, “Broadband Characterization of Materials Using a Dual-Ridged Waveguide,” IEEE Transactions on Instrumentation and Measurement, Accepted (awaiting citation information), vol. TBD, no. TBD, pp. TBD, TBD 2013.
 
5.      B. Crowgey, O. Tuncer, J. Tang, E. Rothwell, S. Balasubramaniam, L. Kempel and M. Havrilla, “Characterization of Biaxial Anisotropic Material using a Reduced Aperture Waveguide,”IEEE Transactions on Instrumentation and Measurement, Accepted (awaiting citation information), vol. TBD, no. TBD, pp. TBD, TBD 2013.
 
6.      M. Havrilla, “Scalar potential depolarizing dyad artifact for a uniaxial medium,” Progress in Electromagnetic Research, vol. 134, pp. 151-168, February 2013.
 
7.      M. Hyde, M. Havrilla, A. Bogle, E. Rothwell and G. Dester, “An Improved Two-Layer Method for Nondestructively Characterizing Magnetic Sheet Materials Using a Single Rectangular Waveguide Probe,” Electromagnetics, vol. 32, no. 7, pp. 411-425, October 2012.
 
8.      M. Seal*, M. Hyde* and M. Havrilla, “Nondestructive complex permittivity and permeability extraction using a two-layer dual-waveguide probe measurement geometry,” Progress in Electromagnetic Research, vol. 123, pp. 123-142, May 2012.
 
9.      G. Dester*, E. Rothwell and M. Havrilla, “A two-iris method for the electromagnetic characterization of conductor-backed absorbing materials using an open-ended waveguide probe,” IEEE Transactions on Instrumentation and Measurement, vol. 61, no. 4, pp. 1037-1044, April 2012.
 
10. †M. Hyde*, M. Havrilla, A. Bogle* and E. Rothwell, “Nondestructive material characterization of a free-space-backed magnetic material using a dual-waveguide probe,” IEEE Transactions on Antennas and Propagation, vol. 60, no. 2, pp. 1009-1019, February 2012.
 
11. J. Massman*, M. Havrilla and K. Whites, “Adapting generally filled cylindrical sheet impedances for electromagnetic compatibility,” IEEE Antennas and Propagation Magazine, vol. 53, no. 3, pp. 150-156, June 2011.
 
12. M. Hyde*, M. Havrilla and A. Bogle*, “A novel and simple technique for measuring low-loss materials using the two flanged waveguides measurement geometry,” Measurement Science and Technology, vol. 22, no. 7, pp. 1-10, July 2011.
 
13. M. Hyde*, S. Cain, J. Schmidt and M. Havrilla, “Material classification of an unknown object using turbulence degraded polarimetric imagery,” Transactions on Geoscience and Remote Sensing, vol. 49, no. 1, pp. 264-276, January 2011.
 
14. M. Hyde*, J. Schmidt, M. Havrilla and S. Cain, “Determining the complex index of refraction of an unknown object using turbulence-degraded polarimetric imagery,” Optical Engineering, vol. 49, no. 12, pp. 1-7, December 2010.
 
15. M. Hyde*, J. Schmidt, M. Havrilla and S. Cain, “Enhanced material classification using turbulence-degraded polarimetric imagery,” Optics Letters, vol. 35, no. 21, pp. 3601-3603, November 2010.
 
16. G. Dester*, E. Rothwell, M. Havrilla and M. Hyde, “Error analysis of a two-layer method for the electromagnetic characterization of conductor-backed absorbing materials using an open-ended waveguide probe,” Progress in Electromagnetics Research B, vol. 26, pp. 1-21, September 2010.
 
17. R. Barton, P. Crittenden, M. Havrilla and A. Terzuoli, “Analytical development of the far zone radiation integral for an arbitrary planar spiral antenna,” IEEE Antennas and Propagation Magazine, vol. 52, no. 2, pp. 19-30, April 2010.
 
18. E. Rothwell, M. Havrilla and S. Dorey, “An improved physical-optics formulation for scattering by a thin resistive strip,” Electromagnetics, vol. 30, no. 5, pp. 1-16, June/July 2010.
 
19. G. Dester*, E. Rothwell and M. Havrilla, “An extrapolation method for improving the accuracy of material characterization using waveguide probes,” IEEE Microwave and Components Letters, vol. 20, no. 5, pp. 298-300, May 2010.
 
20. J. McGuirk*, P. Collins, M. Havrilla and A. Wood, “A Green’s function approach to calculate scattering width for cylindrical cloaks,” Applied Computational Electromagnetics Journal, vol. 25, no. 2, pp. 108-116, February 2010.
 
21. M. Hyde*, J. Schmidt and M. Havrilla, “A geometrical optics polarimetric bidirectional reflectance distribution function for dielectric and metallic surfaces,” Optics Express, vol. 17, no. 24, pp. 22138-22153, November 2009.
 
22. M. Hyde*, M. Havrilla and P. Crittenden, “A novel method for determining R-card sheet resistance using the transmission coefficient measured in free-space or waveguide systems,” IEEE Transactions on Instrumentation and Measurement, vol. 58, no. 7, pp. 2228-2233, July 2009.
 
23. †M. Hyde*, J. Stewart*, M. Havrilla, W. Baker, E. Rothwell and D. Nyquist, “Nondestructive electromagnetic material characterization using a dual waveguide probe: a full wave solution,” Radio Science, vol. 44, no. 3, pp. 1-13, June/July 2009.
24. J. Huang*, A. Wood and M. Havrilla, “A hybrid domain decomposition – finite element method for the analysis of transient electromagnetic scattering by an over-filled cavity in the ground plane,” Communications in Computational Physics, vol. 5, no. 1, pp. 126-141, January 2009.
 
25. † J. Lee*, M. Havrilla, M. Hyde, and E. Rothwell, “Scattering from a cylindrical resistive sheet using a modified physical optics current,” IET Proceedings - Microwaves, Antennas and Propagation, vol. 2, no. 5, pp. 482-491, October, 2008.
 
26. J. Stewart*, M. Havrilla, J. Berrie, N. Kornbau, G. Stenholm and A. Albert, “Material characterization using a hand-held network analyzer,” Journal of Applied Electromagnetics and Mechanics, vol. 28, no. 9, pp. 95-100, September 2008.
 
27. M. Hyde* and M. Havrilla, “A nondestructive technique for determining complex permittivity and permeability of magnetic materials using two flanged rectangular waveguides,” Progress in Electromagnetic Research (PIER), vol. 79, pp. 367-386, January, 2008.
 
28. G. Zelinski*, G. Thiele, M. Hastriter, M. Havrilla and A. Terzuoli, “Half-width leaky wave antennas,” IET Proceedings - Microwaves, Antennas and Propagation, vol. 1, no. 2, pp. 341-348, April 2007.
 
29. J. Luminati*, T. Hale, M. Temple, M. Havrilla and M. Oxley, “Cross-range aliasing reduction in SAR imagery using stepped-frequency waveforms,” IEEE Transactions on Aerospace and Electronic Systems, vol. 43, no. 1, pp. 163-175, January 2007.
 
30. J. Stewart* and M. Havrilla, “Electromagnetic characterization of a magnetic material using an open-ended waveguide probe and a rigorous full-wave multimode model,” Journal of Electromagnetic Waves and Applications, vol. 20, no. 14, pp. 2037-2052, December 2006.
 
31. M. Havrilla and D. Nyquist, “Direct and deembed methods for electromagnetic material characterization,” IEEE Transactions on Instrumentation and Measurement (IM), vol. 55, no. 1, pp. 158-163, February 2006.
 
32. A. Bogle*, M. Havrilla, D. Nyquist, L. Kempel and E. Rothwell, “Electromagnetic material characterization using a partially-filled rectangular waveguide,” Journal of Electromagnetic Waves and Applications, vol. 19, no. 10, pp. 1291-1306, October 2005.
 
33. J. Luminati*, T. Hale, M. Temple, M. Havrilla and M. Oxley, “Doppler aliasing artifact filtering in SAR imagery using randomized stepped-frequency waveforms,” IEE Letters, Vol. 40, No. 22, pp. 1447-1448, 28 October 2004.
 
34. J. Oh*, E. Rothwell, B. Perry* and M. Havrilla, “Natural resonance representation of the transient field reflected by a conductor-backed layer of Debye material,” Journal of Electromagnetic Waves and Applications, vol. 18, no. 5, pp. 571-589, May 2004.
 
35. S. Dorey*, M. Havrilla, L. Frasch, C. Choi and E. Rothwell, “Stepped-waveguide material characterization technique,” IEEE Antenna Propagation Society Magazine, pp. 170-175, February 2004.
 
36. J. Oh*, E. Rothwell, D. Nyquist and M. Havrilla, “Natural resonance representation of the transient field reflected by a conductor-backed lossy layer,” Journal of Electromagnetic Waves and Applications, pp. 673-694, May 2003.
 
37. M. Havrilla and D. Nyquist, “Full-wave analysis of an imperfectly-conducting stripline,” Journal of Electromagnetic Waves and Applications, pp. 739-755, June 2002.

 

Refereed Conference Papers (Full Paper Review)
 
1.      B. Crowgey, K. Akinlabi-Oladimeji, E. Rothwell, M. Havrilla and L. Frasch, “A Triaxial Applicator for the Characterization of Conductor-Backed Absorbing Materials,” Antenna Measurement Techniques Association Conference Proceedings, pp. TBD-TBD, Columbus, Ohio 2013.
 
2.      J. Tang, B. Crowgey, O. Tuncer, E. Rothwell, S. Balasubramaniam, L. Kempel and M. Havrilla, “Characterization of Biaxial Materials using a Partially Filled Rectangular Waveguide,”Antenna Measurement Techniques Association Conference Proceedings, pp. TBD-TBD, Seattle, Washington, October 2012.
 
3.      M. Hyde and M. Havrilla, “Design of an open-ended coaxial probe for broadband, low-footprint nondestructive characterization of PEC-backed materials,” IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, pp. 1599-1602, Graz, Austria, May 2012.
 
4.      M. Havrilla, A. Bogle, M. Hyde and E. Rothwell, “Electromagnetic material characterization of conductor-backed media using a NDE microstrip probe,” Proceedings of the ICEAA International Conference on Electromagnetics in Advanced Applications, pp. 656-659, Torino, Italy, September 2011.
 
5.      M. Havrilla, “Electric and magnetic field dyadic Green’s functions and depolarizing dyad for a magnetic current immersed in a uniaxial dielectric-filled parallel plate waveguide,” URSI General Assembly Proceedings, pp. 1-4, Instanbul, Turkey, August 2011.
 
6.      J. Massman*, M. Havrilla, K. Whites and M. Hyde, “A stepped flange waveguide technique for determining tapered r-card sheet impedance,” Asia Pacific Microwave Conference Proceedings, pp. 1769-1772, Yokohama, Japan, December 2010.
 
7.      M. Hyde* and M. Havrilla, “Reducing the measurement footprint in the characterization of low-loss materials using the flanged-waveguide measurement geometry,” Proceedings of the ICEAA International Conference on Electromagnetics in Advanced Applications, pp. 43-46, Sydney, Australia, September 2010.
 
8.      M. Havrilla and M. Hyde*, “Dual-probe lowloss material extraction technique,” International Symposium on Electromagnetic Theory Proceedings, pp. 268-271, Berlin, Germany, August 2010.
 
9.      M. Havrilla and M. Hyde*, “Nondestructive clamped waveguide lowloss material extraction technique,” Applied Computational Electromagnetics Society Conference Proceedings, pp. 1-4, Tampere, Finland, April 2010.
10. J. Massman*, M. Havrilla and K. Whites, “Adapting sheet impedance for electromagnetic compatibility,” Asia Pacific Microwave Conference Proceedings, pp. 956-959, Singapore, December 2009.
 
11. W. Keichel*, P. Collins, M. Havrilla and M. Saville, “Two dimensional scattering analysis of data-link support strings for bistatic measurement systems,” Antenna Measurement Techniques Association Conference Proceedings, pp. 225-230, Salt Lake City, Utah, November 2009.
 
12. M. Hyde* and M. Havrilla, “Sensitivity of dual waveguide probe complex permittivity and permeability measurement to probe lift-off error,” Proceedings of the ICEAA International Conference on Electromagnetics in Advanced Applications, pp. 192-195, Torino, Italy, September 2009.
 
13. J. Crane* and M. Havrilla, “Effect of center-conductor misalignment on stripline characteristic impedance,” Applied Computational Electromagnetics Society Conference Proceedings, pp. 587-592, Monterey, California, March 2009.
 
14. M. Havrilla, “Full-wave quasi-TEM characteristic impedance of an imperfectly-conducting strip transmission line,” IEEE International Symposium on Antenna Technology and Applied Electromagnetics Proceedings, pp. 1-4, Banff, AB, Canada, February 2009.
 
15. B. Glover, K. Whites, M. Hyde* and M. Havrilla, “Complex permittivity of carbon loaded dielectric sheets with printed metallic square rings,” Proceedings of the 2nd International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, pp. 762-764, Pamplona, Spain, September 2008.
 
16. M. Hyde* and M. Havrilla, “Electromagnetic characterization of two-layer dielectrics using two flanged rectangular waveguides,” IEEE International Measurement Technology Conference Proceedings, pp. 1648-1652, Vancouver, British Columbia, Canada, May 2008.
 
17. M. Havrilla and M. Hyde*, “Dyadic Green’s function of an imperfectly-conducting dual waveguide probe,” Asia Pacific Microwave Conference Proceedings, pp. 741-744, Bangkok, Thailand, December 2007.
 
18. A. Bogle*, M. Havrilla, L. Kempel and E. Rothwell, “Electromagnetic material characterization using a rectangular waveguide to excite a homogeneous media in a parallel-plate waveguide using a transverse slot,” Antenna Measurement Techniques Association Conference Proceedings, pp. 102-105, St. Louis, MO, November 2007.
 
19. J. McGuirk*, M. Havrilla, P. Collins and G. Hilderbrand, “A three-short focused-beam calibration technique for material characterization measurements,” Antenna Measurement Techniques Association Conference Proceedings, pp. 122-126, St. Louis, MO, November 2007.
 
20. J. Stewart*, M. Havrilla, J. Berrie, N. Kornbau, G. Stenholm and A. Albert, “Material characterization using a hand-held network analyzer,” International Symposium on Applied Electromagnetics and Mechanics Proceedings, pp. 11-12, East Lansing, Michigan, September 2007.
 
21. R. Barton*, P. Collins, P. Crittenden, M. Havrilla and A. Terzuoli, “A compact passive ultra-wideband hexagonal spiral antenna array for VHF remote sensing applications,” International Geoscience and Remote Sensing Symposium Digest, pp. 593-595, Barcelona, Spain, July 2007.
 
22. J. Girard*, M. Havrilla and P. Collins, “Derivation of Green's function of microstrip antenna to enhance performance using material perturbations”, IEEE Antennas and Propagation Conference Proceedings, pp. 3920-3923, Honolulu, Hawaii, June 2007.
 
23. A. Bogle*, M. Havrilla and E. Rothwell, “Two-layer parallel-plate Green's function due to a magnetic source for electromagnetic material characterization of conductor backed lossy media,” IEEE Antennas and Propagation Conference Proceedings, pp. 169-172, Honolulu, Hawaii, June 2007.
 
24. R. Barton*, P. Collins, P. Crittenden, M. Havrilla and A. Terzuoli, “A compact passive broadband hexagonal spiral antenna array,” IEEE Antennas and Propagation Conference Proceedings, pp. 4401-4404, Honolulu, Hawaii, June 2007.
 
25. M. Hyde* and M. Havrilla, “Measurement of complex permittivity and permeability using two flanged rectangular waveguides,” IEEE Microwave Theory and Techniques Conference Proceedings, pp. 531-534, Honolulu, Hawaii, June 2007.
 
26. J. Fowler*, M. Temple, M. Havrilla and J. Akerson, “Characterization of zero-doppler clutter removal techniques for ISAR applications,” IEEE Radar Conference Proceedings, Waltham, Massachusetts, pp. 800-804, April 2007.
 
27. J. Stewart* and M. Havrilla, “A novel method for simultaneously extracting electric and magnetic properties of shielding materials using two coupled collinear open-ended waveguides,” Applied Computational Electromagnetics Conference Proceedings, pp. 736-742, Verona, Italy, March 2007.
 
28. J. Stewart* and M. Havrilla, “Simultaneous extraction of permittivity and permeability from a conductor-backed lossy material,” Antenna Measurement Techniques Association Conference Proceedings, pp. 195-200, Austin, Texas, October 2006.
 
29. J. Girard*, M. Havrilla and G. Thiele, “Material perturbations to enhance performance of the Thiele half-width antenna,” IEEE Antennas and Propagation Conference Proceedings, pp. 1617-1620, Albuquerque, New Mexico, July 2006.
 
30. M. Hyde*, M. Havrilla and P. Crittenden, “Free-space and waveguide technique for determining the resistivity of an r-card using the forward transmission coefficient”, Antennas, Radar and Wave Propagation Conference Proceedings, pp. 1-6, Banff, Alberta, CA, July 2006.
 
31. R. Fehlen*, M. Havrilla, L. Frasch, C. Choi, “Air gap error mitigation in coaxial transmission line material characterization measurements,” Antenna Measurement Techniques Association Conference Proceedings, pp. 372-377, Newport, RI, November 2005.
 
32. D. Dwyer*, S. Dorey*, M. Havrilla and G. Simpson, “Efficient electromagnetic material characterization via 2-D rectangular waveguide reduction,” Antennas, Radar and Wave Propagation Conference Proceedings, Banff, Alberta, CA, pp. 100-105, July 2005.
 
33. J. Luminati*, T. Hale, M. Temple, M. Havrilla and M. Oxley, “Generation of raw stepped-frequency waveform echoes using RCS chamber measurements,” IEEE International Radar Conference Proceedings, pp. 927-932, Arlington, VA, May 2005.
 
34. J. Luminati*, T. Hale, M. Havrilla, “Mitigation of complex target Doppler aliasing artifacts in SAR imagery using stepped-frequency waveforms,” Optical Society of America Conference Proceedings, pp. 54-63, Arlington, VA, May 2005.
 
35. G. Zelinski*, M. Hastriter, M. Havrilla, J. Radcliffe, A Terzuoli, G. Thiele, “FDTD analysis of a new leaky traveling wave antenna”, Applied Computational Electromagnetics Society Conference Proceedings, pp. 152-155, Honolulu, HI, April 2005.
 
36. A. Bogle*, M. Havrilla, L. Kempel, D. Nyquist and E. Rothwell, “Electromagnetic material characterization using a partially-filled rectangular waveguide”, Antenna Measurement Techniques Association Conference Proceedings, pp. 419-424, Stone Mountain, GA, October 2004.
 
37. S. Dorey*, M. Havrilla, L. Frasch, C. Choi and E. Rothwell, “Stepped-waveguide electromagnetic material characterization technique”, Antenna Measurement Techniques Association Conference Proceedings, pp. 232-237, Irvine, CA, October 2003.
 
38. A. Bogle*, L. Kempel, E. Rothwell, D. Nyquist, M. Hawley, S. Schneider and M. Havrilla, “Measurement techniques for ferromagnetic materials using a stripline”, IEEE Antennas and Propagation Conference Proceedings, pp. 456-459, Columbus, OH, June 2003.
 
Refereed Conference Papers (Abstract Reviewed)
 
1.      M. Havrilla, “Uniaxial Depolarizing Dyad Artifact Removal via Spectral Domain Analysis,” URSI National Radio Science Meeting Abstracts, Orlando, FL, July 2013.
 
2.      M. Hyde and M. Havrilla, “Broadband, nondestructive characterization of PEC-backed materials using a dual-ridged-waveguide probe,” URSI National Radio Science Meeting Abstracts, Orlando, FL, July 2013.
 
3.      J. Tang, B. Crowgey, O. Tuncer, E. Rothwell, B. Shanker, L. Kempel and M. Havrilla, “Characterization of gyromagnetic materials using a partially-filled waveguide technique,” URSI National Radio Science Meeting Abstracts, Orlando, FL, July 2013.
 
4.      M. Havrilla, A. Bogle, M. Hyde and E. Rothwell, “Electromagnetic material characterization of a curved conductor-backed media using an NDE microstrip probe,” ENDE Electromagnetic Nondestructive Evaluation Conference Abstracts, pp. 61-62, Rio De Janeiro, Brazil, July 2012.
 
5.      B. Crowgey*, O. Tuncer, E. Rothwell, B. Shanker, L. Kempel, and M. Havrilla, “Characterization of gyromagnetic material using a reduced aperture waveguide,” URSI National Radio Science Meeting Abstracts, submitted, Chicago, IL, July 2012.
 
6.      M. Havrilla and M. Hyde, “Complex media, symmetry and material properties,” Material Measurement Working Group Conference Abstracts, pg. 1, Rapid City, SD, October 2011.
 
7.      B. Crowgey*, E. Rothwell, B. Shanker, L. Kempel, O. Tuncer, and M. Havrilla, “Characterization of biaxial anisotropic material using a reduced aperture waveguide,” URSI National Radio Science Meeting Abstracts, pg. URSI124.3, Spokane, WA, July 2011.
 
8.      T. Olney*, M. Havrilla and M. Hyde, “A simple non-destructive method for characterizing non-dispersive, low-loss dielectrics,” URSI National Radio Science Meeting Abstracts, pg. URSI124.6, Spokane, WA, July 2011.
 
9.      M. Havrilla, A. Bogle*, M. Hyde and E. Rothwell, “Material characterization of a curved conductor-backed media using a conformal NDE microstrip probe,” URSI National Radio Science Meeting Abstracts, pg. URSI339.4, Spokane, WA, July 2011.
 
10. M. Havrilla*, A. Bogle, M. Hyde and E. Rothwell, “RF material characterization of conductor-backed media using a NDE microstrip probe,” URSI National Radio Science Meeting Abstracts, pg. 22, Boulder, CO, January 2011.
 
11. M. Havrilla* and M. Hyde*, “Clamped waveguide lowloss material characterization technique,” Microwave Materials and Their Applications Conference Abstracts, pg. 100, Warsaw, Poland, September 2010.
 
12. E. Rothwell and M. Havrilla, “An accurate, closed-form PO approximation for the current induced in a thin resistive strip,” URSI National Radio Science Meeting Abstracts, pg. URSI508.4, Charleston, South Carolina, June 2009.
 
13. G. Dester*, E. Rothwell and M. Havrilla, “Experimental results and error analysis for a two iris, full-wave material characterization method,” URSI National Radio Science Meeting Abstracts, pg. URSI526.5, Charleston, South Carolina, June 2009.
 
14. G. Dester*, E. Rothwell and M. Havrilla, “Experimental results and error analysis for the two layer material characterization method,” URSI National Radio Science Meeting Abstracts, pg. URSI526.4, Charleston, South Carolina, June 2009.
 
15. M. Hyde* and M. Havrilla, “Determining complex permittivity, permeability, and thickness of a pec-backed material using a dual waveguide probe,” European Electromagnetics Conference Proceedings, pg. HPEM48.3, Lausanne, Switzerland, July 2008.
 
16. G. Dester*, E. Rothwell and M. Havrilla, “A Two-Aperture, Full-Wave Method for Material Characterization,” URSI National Radio Science Meeting Abstracts, pg. URSI133.1, San Diego, California, July 2008.
 
17. B. Cakiroglu*, P. Collins, M. Havrilla, K. Sertel and A. Terzuoli, “Multi-scale triangular patch high impedance ground planes to improve the bandwidth of conformal bow-tie antennas – fabrication,” pg. 75, Progress in Electromagnetics Research Symposium Proceedings, Cambridge, Massachusetts, July 2008.
 
18. M. Havrilla, M. Hyde* and J. Stewart*, “MFIE formulation and uncertainty analysis of a dual rectangular waveguide probe utilized for the EM characterization of conductor-backed lossy materials,” North American Radio Science Meeting Proceedings, pp. URSI275, Ottawa, Canada, July 2007.
 
19. G. Hilderbrand, R. Niezgoda and M. Havrilla, “Multi-short calibration technique for VHF material property characterization at elevated temperatures,” Have Forum Conference Abstracts, Eglin Air Force Base, Florida, April 2007.
 
20. J. Lee*, M. Havrilla, M. Hyde and E. Rothwell, “3D bistatic scattering from a curved resistive sheet using a modified PO current and numerical simulation,” URSI National Radio Science Meeting Abstracts, pg. 348, Albuquerque, New Mexico, July 2006.
 
21. M. Havrilla, J. Lee* and E. Rothwell, “Improved RCS from the induced surface currents in illuminated and shadow PO regions of the complex cylindrical resistive shell,” URSI National Radio Science Meeting Abstracts, pg. 347, Albuquerque, New Mexico, July 2006.
 
22. S. Soto-Cabán*, M. Havrilla, P. Barba, E. Rothwell and L. Kempel, “A stepped coaxial waveguide fixture for material characterization,” URSI National Radio Science Meeting Abstracts, pg. 355, Albuquerque, New Mexico, July 2006.
23. A. Bogle*, M. Havrilla, D. Nyquist and L. Kempel, “MFIE formulation for radiation and scattering by a slot in a PEC parallel-plate configuration,” IEEE Antennas and Propagation Conference Abstracts, pg. APSURSI49.5, Washington, DC, July 2005.
 
24. J. Lee*, M. Havrilla, E. Rothwell, “Bistatic scattering from a resistive sheet using a modified PO current,” IEEE Antennas and Propagation Conference Abstracts, pg. APSURSI28.6, Washington, DC, July 2005.
 
25. D. Dwyer*, J. Luminati*, M. Havrilla, E. Rothwell, “Bistatic scattering from a resistive sheet using a modified PO current”, URSI National Radio Science Meeting Abstracts, pg. 87, Boulder, CO, January 2005.
 
26. J. Luminati*, T. Hale, M. Temple, M. Havrilla and M. Oxley, “Doppler aliasing artifact reduction in SAR imagery using stepped-frequency waveforms”, 1st International Waveform Diversity and Design Conference Electronic Abstract, pg. 3, Edinburgh, Scotland, November 2004.
 
27. S. Dorey*, M. Havrilla, W. Baker, D. Nyquist and E. Rothwell, “Error estimates of stepped waveguide material characterization measurements”, IEEE Antennas and Propagation Conference Abstracts, pg. 369, Monterey, CA, June 2004.
 
28. L. Kempel, M. Havrilla, S. Balasubramaniam and S. Schneider, “Calibrated modeling measurements of materials”, Applied Computational Electromagnetics Society Conference Abstracts, pg. 19, Syracuse, N.Y., April, 2004.
 
29. S. Dorey*, M. Havrilla, W. Wood, D. Nyquist and E. Rothwell, “An expression for the physical optics current for a thick resistive layer”, URSI National Radio Science Meeting Abstracts, pg. 52, Boulder, CO, January 2004.
 
30. M. Havrilla and E. Rothwell, “Electromagnetic material characterization using an h-plane step rectangular waveguide”, IEEE Antennas and Propagation Conference Abstracts, pg. 419, Columbus, OH, June 2003.
 
31. A. Bogle*, M. Havrilla, L. Kempel, E. Rothwell and D. Nyquist, “A comparison of one-tier and two-tier stripline calibration techniques for applications in electromagnetic material characterization measurements”, IEEE Antennas and Propagation Conference Abstracts, pg. 421, Columbus, OH, June 2003.
 
32. J. Oh*, E. Rothwell and M. Havrilla, “Natural mode description of the transient field reflected by a planar layer of Debye material”, IEEE Antennas and Propagation Conference Abstracts, pg. 10, Columbus, OH, June 2003.
 
33. J. Lee*, D. Nyquist and M. Havrilla, “Excitation of the discrete and radiation-mode spectrum of a microstrip structure,” Progress in Electromagnetics Research Symposium Proceedings, Cambridge, Massachusetts, pg. 418, July 2002.
 
34. J. Oh*, E. Rothwell, M. Havrilla and D. Nyquist, “Natural resonance representation of the transient field reflected by a conductor-backed lossy layer,” IEEE Antennas and Propagation Conference Abstracts, San Antonio, Texas, June 2002.
 
35. M. Havrilla* and D. Nyquist, “Green’s function for EM field in a microstrip environment with an imperfect ground plane,” IEEE Antennas and Propagation Conference Abstracts, pg. 38, Boston, Mass., June 2001.
 
36. M. Havrilla* and D. Nyquist, “Green’s function for EM field in a parallel-plate environment with imperfectly conducting walls using a Hertzian-potential impedance boundary condition,” IEEE Antennas and Propagation Conference Abstracts, pg. 68, Salt Lake City, Utah, June 2000.
 
37. M. Havrilla*, E. Rothwell, D. Nyquist, K. Chen and L. Frasch, “Effects of aspect angle, polarization and pulse width on the transient interrogation of layered media,” IEEE Antennas and Propagation Conference Abstracts, pg. 113, Orlando, Florida, June 1999.
 
38. F. Kienle*, M. Havrilla*, D. Nyquist and D. Infante, “A comparison of time and frequency-domain measurements in the electromagnetic characterization of materials using a stripline field applicator,” IEEE Antennas and Propagation Conference Abstracts, pg. 112, Orlando, Florida, June 1999.
39. A. Kurtz*, M. Havrilla* and D. Nyquist, “Free-space characterization of the permittivity and permeability of a material using multiple transmission measurements,” URSI National Radio Science Meeting Abstracts, Boulder, Colorado, January 1999.
 
40. M. Havrilla* and D. Nyquist, “Analysis of sample-to-wall gaps in the electromagnetic characterization of materials in rectangular waveguide field applicator measurements,” IEEE Antennas and Propagation Conference Abstracts, pg. 229, Atlanta, Georgia, June 1998.
 
41. M. Havrilla* and D. Nyquist, “De-embedding schemes for extracting material parameters from multi-layered sample measurements,” Progress in Electromagnetics Research Symposium Proceedings, pg. 833, Cambridge, Massachusetts, June 1997.
 
42. M. Havrilla* and D. Nyquist, “Accommodation of wall loss and sample gaps in high-temperature waveguide-based material characterization measurements,” Progress in Electromagnetics Research Symposium Abstracts, pg. 837, Cambridge, Massachusetts, June 1997.
 
43. D. Nyquist and M. Havrilla*, “Origin of the continuous propagation spectrum for printed/integrated waveguides in a planar-layered environment,” Progress in Electromagnetics Research Symposium, Cambridge Abstracts, pg. 625, Massachusetts, June 1997.
 
44. D. Nyquist, J. Grimm* and M. Havrilla*, “Asymptotic radiation field of asymmetric planar dielectric waveguide,” Progress in Electromagnetics Research Symposium Abstracts, Innsbruck, Austria, 1996.
 
45. D. Infante*, D. Nyquist, J. Ross* and M. Havrilla*, “Calibration of microstrip and stripline field applicators using time domain techniques,” URSI National Radio Science Meeting Abstracts, pg. 221, Boulder, Colorado, 1993.
 
46. D. Nyquist, M. Viola*, M. Cloud* and M. Havrilla*, “On Sommerfeld-integral electric field kernels for microstrip-based circuits,” URSI National Radio Science Meeting Abstracts, Boulder, Colorado, 1988.
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