Michael A. Marciniak, Ph.D.
Publications
Refereed journal publications:(Student co-authors are designated with *)
28. " Reflective Inverse Diffusion," K.W. Burgi*, J.M. Ullom, M.A. Marciniak and M.E. Oxley, submitted to Optics Express (Apr 2016).
27. Comparison of micro-facet BRDF model to modified Beckmann-Kirchhoff BRDF model for rough and smooth surfaces," S.D. Butler*, S.E. Nauyoks and M.A. Marciniak, Optics Express Vol. 23, No.22, pp. 29100-29112 (Nov 2015).
26. " Permittivity and permeability tensor extraction technique for arbitrary anisotropic materials," M.R. Benson*, A.G. Kinsley, M.A. Marciniak, M.D. Seal and A.M. Urbas, IEE Photonics Journal Vol.7, No.3, pp.2600613 (1-13) (Jun 2015).
25. " Experimental analysis of BRDF cross section conversion term in direction cosine space," S.D. Butler*, S.E. Nauyoks and M.A. Marciniak, Optics Letters Vol.40, No.11, pp.2445-2448 (Jun 2015).
24. " Effects of a measurement floor on Mueller matrix measurements in a DRR BSDF system," S.E. Nauyoks and M.A. Marciniak, Applied Optics Vol. 54, No.18, pp.5668-5674 (Jun 2015).
23. " NIR skin detection: An application-specific optical system," M.J. Mendenhall, M.A. Marciniak and K.M. Peskosky,* submitted to Applied Optics (Dec 2014).
22. " Fiber laser heating and penetration of aluminum in shear flow," S.M. Baumann,* B.E. Hurst,* M.A. Marciniak and G.P. Perram, Optical Engineering Vol. 53, No. 12, pp. 122510(1-7) (Aug 2014).
21. " Selective thermal emission from a patterned metalized plastic," M.D. Seal,* N.R. Murphy, J.P. Lombardi and M.A. Marciniak, Infrared Physics and Technology Vol. 67, pp. 250-255 (Aug 2014).
20. " Optical characterization of silver-nanorod thin films grown using oblique angle deposition," M. Benson,* P. Shah, M. Marciniak, A. Sarangan, and A. Urbas, Journal of Nanomaterials Col. 2014, pp. 694982(1-8)(May 2014).
19." Partially coherent bidirectional reflectance distribution data computation for modeling periodic plasmonic structures at infrared wavelengths," M.D. Seal* and M.A. Marciniak, Infrared Physics and Technology Vol. 62, pp. 39-44 (Jan 2014).
18. " Design considerations regarding ellipsoidal-mirror-based reflectometers," M.R. Benson* and M.A. Marciniak, Optics Express Vol. 21, No. 23, pp. 27519-27536 (Nov 2013).
17. " Optimization of a tunable infrared Mueller-matrix scatterometer," J.C. Vap,* S.E. Nauyoks and M. A. Marciniak, Measurement Science and Technology Vol. 24, pp. 055901(1-8) (Mar 2013).
16. " Examining the validity of using a Gaussian Schell-model source to model the scattering of a fully coherent Gaussian beam from a rough impedance surface,& rdquo S. Basu, M.W. Hyde IV, S.J. Cusumano, M.A. Marciniak and S.T. Fiorino, Optical Engineering Vol. 52, No. 3, pp. 038001(1-9) (Mar 2013).
15. " Bidirectional scatter measurements of a Guided Mode Resonant Filter photonic crystal structure," M.A. Marciniak, S.R. Sellers,* R.B. Lamott* and B.T. Cunningham, Optics Express Vol. 20, No. 25, pp. 27242-27252 (Dec 2012).
14. " Wavelength- and temperature-dependence of CW laser absorptance in Kapton® thin films," W.J. Palm,* M.A. Marciniak, G.P. Perram, K.C. Gross, W.F. Bailey and C.T. Walters, Optical Engineering Vol. 51, No. 12, pp. 121802(1-8) (Dec 2012).
13. " Modeling bi-static spectral measurements of temporally evolving reflected and emitted energy from a distant and receding target," Cusumano, S.J., S.T. Fiorino, R.J. Bartell, M.J. Krizo, W.F. Bailey, R.L. Beauchamp* and M.A. Marciniak, Journal of Applied Remote Sensing Vol. 5, pp. 053549(1-14) (Sep 2011).
12. " Path-averaged Cn2 estimation using a laser-and-corner-cube system," W.P. Cole* and M.A. Marciniak, Applied Optics Vol. 48, No. 21, pp. 4256-4262 (Jul 2009).
11. " Frequency domain fluorimetry using a mercury vapor lamp," M.J. Bohn, M.A. Lundin* and M.A. Marciniak, Journal of Applied Remote Sensing Vol. 3, pp. 033524(1-12) (Apr 2009).
10. " Atmospheric-turbulence-effects correction factors for the laser range equation,& rdquo W.P. Cole,* M.A. Marciniak and M.B. Haeri, Optical Engineering Vol. 47, No. 12, pp. 126001(1-11) (Dec 2008).
9. " Discrimination between electronic and optical blooming in an InSb focal plane array under high-intensity excitation," B.T. Wysocki* and M.A. Marciniak, Infrared Physics and Technology Vol. 51, pp. 137-145 (Oct 2008).
8. " Electrical characterization of Si-ion implanted AlxGa1-xN annealed at lower temperatures," M.-Y. Ryu, Y.K. Yeo, T.W. Zens,* M.A. Marciniak, R.L. Hengehold and T.D. Steiner, Physica Status Solidi (a) Vol. 203, No. 7, pp. 1650-1653 (May 2006).
7. " Electrical and optical characterization studies of lower dose Si-implanted AlxGa1-xN," M.-Y. Ryu, Y.K. Yeo, M.A. Marciniak, T.W. Zens,* E.A. Moore,* R.L. Hengehold, and T.D. Steiner, Journal of Electronic Materials Vol. 35, No. 4, pp. 647-653 (2006).
6. " Analysis of uncertainties in infrared camera measurements of a turbofan engine in an altitude test cell," T.A. Morris,* M.A. Marciniak, G.C. Wollenweber and J.A. Turk, Infrared Physics and Technology, Vol. 48, pp. 130-153 (Sep 2006).
5. " Wave-optics modeling of aberration effects in optical cross section measurements," N.J. Abel,* M.A. Marciniak, M.B. Haeri and S.C. Cain, Optical Engineering Vol. 44, No. 8, pp. 084302(1-8) (Aug 2005).
4. " High electrical activation efficiency obtained from Si-implanted Al0.18Ga0.82N," M.-Y. Ryu, Y.K. Yeo, M.A. Marciniak, R.L. Hengehold and T.D. Steiner, Journal of Applied Physics Vol. 96, No. 11, pp. 6277-6280 (Dec 2004).
3. " Optical characterization of molecular beam epitaxially grown InAsSb nearly lattice matched to GaSb," M.A. Marciniak, R.L. Hengehold, Y.K. Yeo, and G.W. Turner, Journal of Applied Physics Vol. 84, No. 1, pp. 480-488 (Jul 1998).
2. " Temperature dependence of the direct band-gap energy and donor-acceptor transition energies in Be-doped GaAsSb lattice matched to InP," K.G. Merkel, V.M. Bright, M.A. Marciniak, C.L.A. Cerny, and M.O. Manasreh, Applied Physics Letters Vol. 65, No. 19, pp. 2442-2444 (Nov 1994).
1. " Phase locking laser diodes using photo-refractive coupling," P.D. Hillman and M.A. Marciniak, Journal of Applied Physics Vol. 66, No. 12, pp. 5731-5737 (Dec 1989).